The HT-T1D system moves beyond standard automated optical inspection by reconstructing the interior of glass substrates in three dimensions. Using visible-light holotomography, the device maps refractive-index distributions to uncover the precise location, morphology, and depth of internal flaws. Because the process is non-destructive, engineers can track how individual defects evolve across different manufacturing stages, such as laser drilling or etching, potentially reducing analysis time from weeks to minutes.
Tomocube Debuts HT-T1D for 3D Glass Substrate Defect Analysis
As glass substrates emerge as the foundation for next-generation AI accelerators and high-bandwidth memory, manufacturers are struggling with micro-defects that threaten production yields. Tomocube is addressing this bottleneck with the HT-T1D, a new desktop holotomography system designed to identify internal defects without destroying the sample.
To support this hardware, the company also launched its TAMI software platform. This interface processes 3D refractive-index data to generate actionable engineering reports. According to CEO YongKeun Park, the system is engineered to help manufacturers move quickly from defect detection to root-cause analysis, a transition he identifies as essential for competitive mass production. Beyond defect identification, the technology is also capable of functional metrology for glass photonic integrated substrates used in co-packaged optics, where refractive index measurements directly correlate to device performance.
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